Cambridge University Press
052184875X - Electron Microprobe Analysis and Scanning Electron Microscopy in Geology - by S. J. B. Reed
Frontmatter/Prelims

ELECTRON MICROPROBE ANALYSIS AND
SCANNING ELECTRON MICROSCOPY IN GEOLOGY

This book describes electron microprobe analysis (EMPA) and scanning electron microscopy (SEM) specifically from a geological viewpoint. No prior knowledge is assumed and unnecessary technical detail is avoided, in order to keep the book easily accessible to new users of these techniques.

The principles of electron–specimen interactions and instrumentation are covered in the first part of the book. The mechanisms involved in SEM (secondary and backscattered electron) image formation are then explained, with full consideration of digital imaging techniques. The operating principles of energy- and wavelength-dispersive X-ray spectrometers are described, as well as ancillary techniques including cathodoluminescence (CL) and electron backscatter diffraction (EBSD). Procedures for qualitative and quantitative X-ray analysis (using either electron microprobe or SEM instruments) are described in detail. The production of X-ray ‘maps’ showing element distributions is also described, with examples. Finally the subject of specimen preparation is discussed. There is an emphasis throughout on specifically geological aspects not covered in books aimed at a more general readership.

This updated version of the first (1996) edition takes full account of recent developments and is intended for geological graduate students and postdoctoral workers, as well as those in commercial laboratories. It is also an invaluable accompaniment to courses for geological EMPA and SEM users.

DR REED is affiliated to the Department of Earth Sciences at the University of Cambridge. After studying physics at Southampton University, he gained a Ph.D. from the University of Cambridge in 1964 for research in using EMPA to analyse iron meteorites. He went on to be a Scientific Officer at the Natural History Museum, London from 1965 until 1970 before his appointment as Senior Research Fellow at the Australian National University, Canberra in 1970, where he implemented a new system for quantitative ED analysis. From 1974 until his retirement in 2002, Dr Reed was at the Department of Earth Sciences, University of Cambridge with research interests including ion and electron microprobe analysis and developing simulation software. In 1981 he was awarded the Microbeam Analysis Society Presidential Award for his outstanding scientific contribution to the theory and practice of microbeam analysis, followed in 1984 by honorary life membership. He has written, and contributed to, several books on the subject, including Electron Microprobe Analysis (Cambridge University Press, first edn 1975, second edn 1993).

ELECTRON MICROPROBE ANALYSIS
AND SCANNING ELECTRON
MICROSCOPY IN GEOLOGY

S. J. B. REED

University of Cambridge

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© S. J. B. Reed 2005

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